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    Please use this identifier to cite or link to this item: http://ir.lib.ksu.edu.tw/handle/987654321/8923

    Title: 基於labview的自動檢測系統設計
    LabVIEW-based Automatic Testing System Design
    Authors: 賴秋庚(Chiu-Keng Lai)
    劉育瑋(Yu-Wei Liu)
    陳柏維(Bo-Wei Chen)
    李英豪(Ying-Hao Li)
    Keywords: LabVIEW
    Automatic Testing System
    Date: 2008-09-05
    Issue Date: 2010-03-02 14:06:09 (UTC+8)
    Abstract: This study adopted LabVIEW system to develop a virtual
    instrument automatic testing system. The designed system
    the temperature, pressure and flow of the set under testing through
    PCI-1710HG interface card made by Advantech Corp.,
    communicates with isolated tester and AC power supply
    RS232. The designed system can be operated by manual
    automatic execution once it is triggered. The testing system
    really applied to production line to test products. It shows that
    performance of this virtual instrument system is acceptable
    easy using.
    Relation: 台灣電子電力研討會暨展覽會
    Appears in Collections:[電機工程系所 ] 2008第七屆台灣電力電子研討會暨展覽會

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