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    Please use this identifier to cite or link to this item: http://ir.lib.ksu.edu.tw/handle/987654321/8347

    Title: 溫度調節與故障偵測電路
    Temperature Adjustment and Failure Detection Circuits
    Authors: 黃敬斌(J.-B. Huang)
    李坤彥(K.-Y. Lee)
    Keywords: 元件可靠度
    Date: 2008-09-05
    Issue Date: 2010-01-29 12:27:34 (UTC+8)
    Abstract: 隨著半導體製程的進步,元件體積逐漸減小,元件可靠
    As the evolution of semiconductor proceeds, MOSFETs gate
    oxide thickness and dimensions of scale shrink in circuit design.
    Reliability problems occur and need to be considered early in the
    design step. Because temperature is the critical factor of reliability
    problems, the main purpose of this thesis is to develop a circuit
    for adjusting temperature and replacing the damaged
    switching device. The circuit adjusts the temperature without inducing
    excess switching loss as main switching device overheats.
    In addition, when the main device is damaged, a backup device
    will completely take over the function of this main device, keeping
    the normal operation of this system. The indicator light will
    turn on for the purpose of replacing the damaged device.
    Index terms: reliability problems, adjust temperature
    Relation: 台灣電子電力研討會暨展覽會
    Appears in Collections:[電機工程系所 ] 2008第七屆台灣電力電子研討會暨展覽會

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