English  |  正體中文  |  简体中文  |  Items with full text/Total items : 25831/26425 (98%)
Visitors : 8024288      Online Users : 473
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ksu.edu.tw/handle/987654321/8347


    Title: 溫度調節與故障偵測電路
    Temperature Adjustment and Failure Detection Circuits
    Authors: 黃敬斌(J.-B. Huang)
    李坤彥(K.-Y. Lee)
    黃智柏(J.-B.Huang)
    Keywords: 元件可靠度
    溫度調節
    Date: 2008-09-05
    Issue Date: 2010-01-29 12:27:34 (UTC+8)
    Abstract: 隨著半導體製程的進步,元件體積逐漸減小,元件可靠
    度分析亦日漸重要。由於溫度是影響元件可靠度的重要因
    素,因此本論文目的在於研製降低開關元件溫升與判斷元件
    故障時,可在不影響整體運作下更換元件之偵測電路。當開
    關元件溫度高於預設值後,溫度調節機制便開始啟動,而啟
    動的過程中,並不會造成額外的切換損失。若主要開關元件
    發生損壞的情況,故障偵測電路會立即啟動備用開關,用以
    代替原先主要開關之功能,同時故障指示燈亮起用以提醒使
    用者更換故障元件。
    As the evolution of semiconductor proceeds, MOSFETs gate
    oxide thickness and dimensions of scale shrink in circuit design.
    Reliability problems occur and need to be considered early in the
    design step. Because temperature is the critical factor of reliability
    problems, the main purpose of this thesis is to develop a circuit
    for adjusting temperature and replacing the damaged
    switching device. The circuit adjusts the temperature without inducing
    excess switching loss as main switching device overheats.
    In addition, when the main device is damaged, a backup device
    will completely take over the function of this main device, keeping
    the normal operation of this system. The indicator light will
    turn on for the purpose of replacing the damaged device.
    Index terms: reliability problems, adjust temperature
    Relation: 台灣電子電力研討會暨展覽會
    Appears in Collections:[電機工程系所 ] 2008第七屆台灣電力電子研討會暨展覽會

    Files in This Item:

    File Description SizeFormat
    溫度調節與故障偵測電路.pdf776KbAdobe PDF20View/Open


    All items in KSUIR are protected by copyright, with all rights reserved.


    本網站之所有圖文內容授權為崑山科技大學圖書資訊館所有,請勿任意轉載或擷取使用。
    ©Kun Shan University Library and Information Center
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback