Kun Shan University Institutional Repository:Item 987654321/3585
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    題名: Analytical solution of flexural vibration responses on nanoscale processing using atomic force microscopy
    作者: HorngThin-Lin (洪興林)
    關鍵詞: Modal superposition method
    Flexural vibration problem
    Nanomachining process
    Tip holder
    Atomic force microscope (AFM)
    日期: 2009-03-19
    上傳時間: 2009-08-15 00:47:50 (UTC+8)
    摘要: An analytical solution is developed to deal with the flexural vibration problem during ananomachining process which involves an atomic force microscope (AFM) cantilever. Themodal superposition method is employed to analyze the response of an AFM subjected to acutting force with an excitation force of an arbitrarily chosen frequency. The cutting forceswere transformed into distributed transversal and bending loading, and were applied tothe end region of the AFM by means of the tip holder. The effects of transverse stress andbending stress were adopted to solve the dynamic model. Based on the result, applying acutting force with an excitation force near the high-order modal frequencies and using awide tip holder are recommended when nanoscale processing using AFM is performed.
    關聯: journal of materials processing technology 2 0 9 ( 2 0 0 9 ) 2940–2945
    顯示於類別:[機械工程系所] 期刊論文

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    洪興林-97獎助申請表(論文刊登)論文3-Analytical Solution of Flexural Vibration Responses on Nanoscale Processing Using Atomic Force MicroscopyPROTEC_12252.pdf815KbAdobe PDF1156檢視/開啟


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