The tribo-electrification mechanisms had been successfully applied to dynamic monitorthe tribological properties between the metal films by our laboratory members. Moreover, the novelmethod of using continuous tribo-electrification variations for monitoring showed more sensitiveand discriminative than that by the continuous friction coefficient variations as usual. However, theabove method is only suitable for the conducted material pairs.This study is based on the above views to further develop another novel method for dynamicmonitoring the tribological properties between the semiconductor films in the friction process. Theexperiment was conducted by the self-developed friction tester and its measure system. Thecontinuous variations of electrical contact resistance and friction coefficient were measured formonitoring the timings of film rupture between the semiconductor films. Moreover, the wear losswas measured by an accuracy balance and the SEM was used to observe the structures of materialtransfer. Therefore, the wear mechanisms of Ti sliding against Ti with TiO2-film under differentnormal loads can be investigated.According to the experimental results of this study, the novel method of using electrical contactresistance variations does show great potentialities for dynamic monitoring the tribologicalproperties of the TiO2-film.
Materials Science Forum Vol. 594 (2008) pp 383-388